Ulvac – High speed spectroscopic ellipsometers

Spectroscopic ellipsometer.

Source: Ulvac

Ulvac has introduced two new high speed spectroscopic ellipsometers for thickness and optical parameter measurement of thin films on 200mm or 300mm diameter wafers.

You must be a subscriber to read this content

If you already subscribe, please sign-in now

Subscribe to Gas World

 

Get instant access to must-read content today!

To access hundreds of features, subscribe today! At a time when the world is forced to go digital more than ever before just to stay connected, discover the in-depth content our subscribers receive every month by subscribing to gasworld.

Don’t just stay connected, stay at the forefront – join gasworld and become a subscriber to access all of our must-read content online from just $310.