Pittcon is well known in scientific and technical circles as the world’s largest annual conference and exposition for laboratory science. It is known as a ‘must see’ for those interested in the latest analytical tools for analysing gases and impurities.
This year’s conference and expo runs from 13th March through to 18th March at the Georgia World Congress Centre in Atlanta, Georgia, US. At least 950 exhibitors – a similar turnout to last year’s event – are expected on the floor, showcasing the latest technology and instrumentation.
In addition a diverse technical programme featuring over 2,200 abstracts to technical presentations and more than 100 short courses will be on offer, providing opportunities to stay up-to-date or delve into new areas. Pittcon’s networking sessions also provide the chance to exchange innovative ideas with scientists from around the world.
A wide range of speakers and topics will be on show at the event, including Peter Griffiths from the University of Idaho, who will be discussing atmospheric monitoring by open-path FT-IR spectroscopy.
Steven Sharpe, from Pacific Northwest National Lab/Department of Energy (DOE), will be adding his insights, looking at infra-red spectroscopy’s application for both in-situ and remote analysis of gaseous atmospheric samples.
Airgas Specialty Gases’ Daniel Bartel will also step-up, to share his research into modelling how component concentrations vary due to vapour-liquid equilibrium as a liquefied refinery calibration standard is depleted. Meanwhile Jian Hou of Gow-Mac Instrument Co. presents the results of using a newly-developed toxic gas analyser (TGA-900), which possesses a wide linearity range of 0-10 ppmv, a lower detection limit of 10 ppbv, and a good precision of 5%. In particular, the instrument has applications in measuring water-soluble toxic gases.
A particular presentation of interest may be that of Hiroyuki Ono, of Taiyo Nippon Sanso Corporation (TNSC). As semiconductor industries require lower moisture impurity in monosilane due to high performance of semiconductor devices, new analytical methods capable of measuring moisture in monosilane with higher sensitivity are required.
Tackling this topic, Ono will discuss the best analytical condition on trace moisture analysis of monosilane by cavity ring-down spectroscopy (CRDS).
Before attending, those interested in the event are strongly recommended to take a tour of the event website, which has full details of exhibitors, attendees and the technical programme, as well as practical information such as where to stay.
Among those exhibiting will be Agilent Technologies, Airgas, Air Liquide America Specialty Gases LLC, Air Products, Analytical Flow Products, Baseline-MOCON Inc.,
CONCOA, Delta F Corporation, GOW-MAC Instrument Corp., MATHESON, MEECO Inc., nexAir, Parker Hannifin Corporation, Peak Scientifc Instruments Ltd, Praxair Specialty Gases & Equipment, Tiger Optics and many, many more.
A full list is available at: www.pittcon.org/expo/exhibitorlist.php